AFM (Atomic Force Microscope) is an analytical instrument used to study the surface structure of solid materials, including insulators. It studies the surface structure and properties of materials by detecting extremely weak atomic interactions between the surface of the test sample and a micro force sensitive element. The key components of AFM include probes and scanning tubes, which detect the interaction between the two by controlling the movement of the probe tip within a sufficiently close range to the sample surface. This device can accurately observe the three-dimensional morphology of the sample surface at the nanoscale in the atmospheric environment, and can study the physical and chemical properties of the sample surface, such as surface component differences, surface potential, magnetic field forces, and other surface forces, as well as the measurement of interaction forces. Meanwhile, AFM can also perform nanoscale etching and processing.
AFM supports multiple testing modes, including fully automatic scanning mode, contact mode, tapping mode, lifting mode, phase imaging, transverse force microscope, torque resonance mode, etc. It also supports electrical testing functions such as surface potential, surface electric field force, and conductive atomic force microscope. In addition, AFM is also applied in measuring forces and micro structural processing by changing forces, which is very useful for studying the interactions between particles.
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