AFM

Machine Features:

1 HJAFM-1100 brings scanning accuracy at the angstrom level, while providing multiple measurement modes for phase, electric field, magnetic field, and conductivity, providing fast and accurate measurement data for laboratories. It is one of the best tools for nanoscience experiments and research.

2 Z-direction noise level less than 0.04nm

3. 200mm*200mm sample platform or 300mm *300mm sample platform (optional)

4. Standard with multiple working modes

5. Intelligent needle insertion and scanning

6. Automatic positioning and needle changing function (optional)

Technical Parameters:

1. Scanner

  ·Scanning range of XY axis scanner: 100 μ m x 100 μ m, linear error: less than 0.1%

  ·Z-axis scanner scanning range: 10 μ m (can be upgraded/customized for larger ranges)

2. Sports platform X/Y travel: 200mm or 300mm (optional)

3. Sample holder sample size: 200mm x 200mm or 300mm x 300mm (optional)

4. Maximum sample height: 48mm

Working mode:

1. Static force mode

2. Dynamic force mode

3. Phase imaging mode

4. Lateral force mode

5. Magnetic mode

6. Electrostatic mode

7. Extended resistance microscope (conductivity)

8. Force modulation mode

9. Nanoetching

10. Spectral line measurement mode

   ·Force— distance curve

   ·Amplitude —distance curve

   ·Voltage— distance curve